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Spectroscopy & Structure Characterization
FTIR Spectrometer (FTIR)
Infrared spectroscopy system for identifying functional groups and chemical bonds in samples.
X-Ray Diffractometer (XRD)
X-ray diffraction system for determining crystal structure, phase purity, and crystallinity.
Optical Profilometer
Non-contact 3D optical profilometer using fringe projection to map surface micro-topography.
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